The 2nd edition of the BIST Symposium on Microscopy, Nanoscopy and Imaging Sciences will take place on February 8th 2019 at ICFO (Castelldefels, Barcelona) from 9.00h to 18.00h.
The event will include a series of short talks and discussions on Optical Microscopy, Electron Microscopy, Scanning probe Microscopy, Raman Imaging and Spectroscopy, Imaging Technology and approaches in Astrophysics / Cosmology, featuring experts in the various fields.
Taking advantage that this Symposium is also the culmination of the BIST-UPF Master’s Winter School, there will be a poster presentation by the master students in which they will be presenting their current research.
Download programme: BIST 2019 Symposium Agenda
Registration: If you would like to attend the symposium, please register here: Symposium Registration (seating is limited).