I completed my PhD in Materials Physics and Chemistry from the Institute of Metal Research (IMR), Chinese Academy of Sciences (CAS) in 2017. My research focused on the design, growth and aberration-corrected (scanning) transmission electron microscopy (Cs-corrected STEM) investigation of domain patterns, interfaces and defects in ferroelectric thin films.
After receiving PhD degree, I held post-doctoral research associate position in the Australia Center for Microscopy and Microanalysis (ACMM), University of Sydney (USYD), and focused on the micro- and nanoscale mechanical performances investigation of relaxor ferroelectrics in-situ in scanning electron microscope (SEM) and transmission electron microscope (TEM).
I moved to Catalan Institute of Nanoscience and Nanotechnology (ICN2) in the middle of 2019 as a PROBIST Postdoctoral Fellow. I am currently working on the oxide interfaces investigation under the supervision of Prof. Gustau Catalan and Prof. Jordi Arbiol.
Up to now (Aug. 2020), I have published 23 peer-reviewed in the field of functional oxides and/or transmission electron microscopy. My h-index is 11 and has more than 310 citations (google scholar).
Direct Observation of Oxide Interfacial Fields
The coupling of lattice, orbital, charge, and spin degrees of freedom at oxide interfaces not only influences the macroscopic physic behaviours but also gives rise to multiple functionalities at these interfaces. My current project is atomic scale imaging oxides interfaces using aberration corrected Transmission Electron Microscopy (TEM), which enables the atomic scale structure, charge and field mapping. The interfaces that we are interested in including ferroelectric/electrode interfaces, domain walls in ferroelectrics and the ferroelectric/antiferroelectric interfaces in antiferroelectric thin films. Our objective is to modulate and establish the structural-properties relationship of these interfaces.